TNP has a suite of advanced pattern recognition innovations that preprocess and detect anomalies in any/all types of time series signals relating to the health of dynamically executing components, subsystems, and integrated hardware-software systems. Sensor time-series signals from manufacturing assets provide quantitative metrics associated with physical variables, performance variables, energy efficiency, and various quality-of-service (QOS) metrics. These signals are processed in real time using an advanced pattern-recognition technique, called AI-MSET, for predictive and prescriptive maintenance in all types of manufacturing facilities. TNP’s suite of AI-MSET innovations achieves extremely high prognostic sensitivity for detection of the incipience or onset of subtle anomalies in all types of manufacturing assets and processes, but with ultra-low false-alarm and missed-alarm probabilities, to help manufacturing customers increase production-asset reliability margins and system availability goals while reducing costly downtime from spurious false alarms in the customer's critical assets, and achieving significantly reduced scrap rates.
TNP's suite of AI-MSET innovations brings significant advantages over conventional machine monitoring and machine learning (ML) approaches for real-time surveillance of business-critical manufacturing assets. These advantages include:
By extending the prognostic surveillance envelope to include customer's production assets, programmable logic controllers (PLCs), power supplies, motor-operated valves, and interconnecting networks, TNP’s AI-MSET solutions can help the customer achieve higher availability with lower Operation and Maintenance (O&M) costs for manufacturing operations.
This brief white paper gives an overview of the key elements embodied in AI-MSET-related portfolio of innovations.
Many industrial processes have embedded diagnostic systems and online statistical process control techniques that perform real-time analysis of process variables. Most of these systems employ simple tests (e.g., threshold, mean value + three-sigma, SPC control-chart thresholds, etc.) that are sensitive only to gross changes in the process mean, or to high step changes or spikes that exceed some threshold-limit test, to determine whether or not a failure has occurred or a process is drifting out of control. These conventional methods suffer from either high false-alarm rates (if thresholds are set too close) or high missed alarm rates (if the thresholds are set too wide).
For high-throughput industrial facilities, false alarms are very costly in terms of plant or physical-asset down time. Missed alarms can be even more costly when incipient problems are not identified and expensive assets fail catastrophically.
AI-MSET provides a superior surveillance tool because it is sensitive not only to disturbances in signal mean, but also to very subtle changes in the statistical moments of the monitored signals and the patterns of correlation between/among multiple types of signals. AI-MSET employs a statistical pattern recognition technique called the Sequential Probability Ratio Test (SPRT), which provides the basis for detecting very subtle statistical anomalies in noisy process signals at the earliest mathematically possible time, thereby providing actionable warning-alert information on the type and the exact time of onset of the disturbance. Instead of simple threshold limits that trigger faults when a signal increases beyond some threshold value, the SPRT technique is based on user-specified false-alarm and missed-alarm probabilities, allowing the end user to control the likelihood of missed detection or false alarm. For sudden, gross failures of sensors or system components the SPRT annunciates the disturbance as fast as a conventional threshold limit check. However, for slow degradation that evolves over a long time period, such as gradual decalibration bias or drift in a sensor, the SPRT raises a warning of the incipience or onset of the disturbance long before it would be apparent to any conventional threshold-based rules.
TNP’s AI-MSET comes from the class of mathematics called nonlinear, nonparametric (NLNP) regression that was originally developed by Argonne National Laboratory (ANL) in the 1990’s for high-sensitivity proactive fault monitoring applications in commercial nuclear power applications. The original ANL AI technique was called MSET (for the Multivariate State Estimation Technique). MSET was spun off to a variety of mission-critical and safety-critical industries. TNP was the first company to develop MSET-based prognostic tools for enterprise computing health-monitoring applications. TNP now has a portfolio of MSET and SPRT enabled innovations that perform Intelligent Data Preprocessing, are tuned automatically, and provide high-sensitivity prognostics with ultra-low false-alarm probabilities. This end-to-end prognostic framework, which solves sensor, signal, and asset prognostic challenges that no other ML techniques can solve (documented herein), is called AI-MSET.
The AI-MSET dataflow structure is similar to that of most time-series regression ML approaches, consisting of a training phase and a monitoring phase (Figure 1 below). The training procedure is used to characterize the monitored assets and processes using historical, fault-free operating data covering the envelope of possible operating regimes for the system variables under surveillance. This training procedure evaluates the available training data and automatically selects a subset of the data observations (using a similarity operator) that are determined to best characterize the monitored asset's normal operation. It creates a stored model of the equipment that is used in the monitoring procedure to estimate the expected values of the signals under surveillance. In the monitoring step, new observations for all the asset signals are first acquired. These observations are then used in conjunction with the previously trained AI-MSET model to estimate the expected values of the signals. AI-MSET estimates are extremely accurate, with error rates that are typically less than 1 percent of the standard deviation of the input signal. [Important note for Manufacturing Prognostics: Conventional threshold-alarm monitoring cannot catch the onset of anomalies when the degradation is smaller than the noise band. TNP’s AI-MSET proactively catches the onset of subtle anomalies even when the anomalies are “below the noise floor”.]
The end-to-end processing steps taken during the AI-MSET surveillance phase are shown in Figure 1.
Figure 1: AI-MSET surveillance-phase block diagram
The difference between a signal's real-time AI-MSET estimate and its directly sensed value is termed a residual. The residuals for each monitored signal are used as an anomaly indicator for sensor and equipment faults. Instead of using simple thresholds to detect fault indications, AI-MSET's fault detection procedure employs a SPRT (sequential probability ratio test) to determine whether the residual error value is uncharacteristic of the learned process model and thereby indicative of a sensor or equipment fault. The SPRT algorithm is a significant improvement over conventional threshold detection processes in that it provides more definitive information about signal validity with a quantitative confidence factor through the use of statistical hypothesis testing. This approach allows the user to specify false alarm and missed alarm probabilities, allowing end-customer control over the likelihood of false alarms or missed detection.
In addition to detecting signal, process, and system degradation, AI-MSET estimates also are used to continuously validate sensor operability. Detecting sensor inoperability is important for two reasons: (1) if the sensor is protecting the system from extreme operating conditions (e.g. high temperatures, overvoltage events, abnormal vibrational level), then a malfunctioning sensor effectively incapacitates the intended protection mechanism, and (2) if the sensor is part of a feedback-control loop, then the system may potentially enter an unstable state because of faulty input provided by the malfunctioning sensor.
Redundant sensors can ensure sensor operability at the expense of duplicated sensor hardware, but for industrial and computer applications where redundant sensors would be prohibitively costly, AI-MSET can be used to provide analytical redundancy for the sensors. The AI-MSET estimate for a signal at time t leverages the redundant information content read at t from multiple, separate (but correlated) sensors to provide a highly accurate “inferential sensor”.
Although the primary objective of applying AI-MSET is to achieve proactive fault monitoring, the fact that AI-MSET provides continuous sensor operability validation is a side benefit that is extremely valuable for asset monitoring. A typical industrial manufacturing plant or compute farm can contain thousands of physical sensors. It is an unfortunate fact that these physical sensors often have a shorter mean-time-between-failure (MTBF) than the expensive assets they are supposed to protect.
TNP's AI-MSET prognostic solutions have the unique capability to disambiguate between sensor disturbances versus disturbances in the assets being monitored. It is no longer necessary to shut down a $1M asset and discover that the cause was a $2 sensor drifting out of calibration.
One common failure mode for sensors is known as "stuck-at" failures (meaning the transducer retains its last mean value but is no longer responding to changes in the sensed variable). When this occurs in an industrial asset, then the asset is vulnerable to serious degradation if there is a thermal, mechanical, or electrical event or excursion. Even more likely, however, is that as the sensor eventually drifts out of calibration, which may cause an asset to be unnecessarily be shut down from a "false alarm" event. TNP's prognostic system surveillance continuously monitors the telemetry signals associated with physical sensors and actuates a warning flag when it detects the incipience or onset of sensor degradation or sensor decalibration events. AI-MSET2 has unique benefits for equipment surveillance because it unambiguously distinguishes between sensor degradation and component/process degradation.
It is important to note that conventional threshold-limit-based industrial asset monitoring techniques will never catch stuck-at faults in sensors. AI-MSET not only detects all types of sensor degradation events (including stuck-at faults), but can then swap in a highly accurate inferential sensor. The inferential sensor can be used indefinitely, or until a scheduled maintenance window, when the identified degraded sensor(s) can be replaced (or recalibrated) with no loss of business-critical uptime for the assets.
Figure 2: AI-MSET sensor failure detection
Although MSET and SPRT are very powerful algorithms, like all ML techniques they require accurate training data to be useful. There can be many problems with time series data such as missing values, uneven sampling rates, quantization errors, and so forth. TNP has a suite of data pre-processing tools that fix these problems with the data, thus allowing MSET to provide robust anomaly detection.
(1) Correcting for unevenly sampled signals - Analytical Resampling Process (ARP)
Because the various sensor data streams may originate from differing sampling rates, this important pre-processing step uses interpolation-based upsampling and downsampling methods to generate uniform sampling intervals for all telemetry time series. Moreover, it is very common for the various asset clocks, control network clocks, and environmental variable-monitoring clocks to be out of sync. Clock mismatch issues will cause almost all machine learning prognostic algorithms to fail. TNP's patented ARP prevents this issue with real-time phase synchronization
Figure 3: ARP--Correcting for unevenly sampled signals
(2) Dequantization of Quantized Sensor Signals
A second challenge with using telemetry signatures in computational machine learning algorithms is quantization, which can severely impact the resolution of the telemetry signals and hence accuracy of the computed results. Quantization occurs from the low resolution A/D chips typically used in industrial equipment transducers. TNP's data pre-processing solution has built-in TNP-patented techniques to "un-quantize" signals in real time, in effect producing high-accuracy output signatures from low-resolution input signals.
Figure 4: Correcting for signal quantization
(3) Missing Value Imputation (MVI)
AI_MSET’s valuable ability to distinguish between a failed component and a failed sensor was described earlier. The same technology can be used to accurately calculate missing values, which can be useful if those values are being used in other applications.
TNP’s suite of advanced pattern-recognition innovations for time-series anomaly detection is unmatched in the industry. The MSET2 ecosystem is comprised of a synergistic integration of the AI-MSET and SPRT techniques with a set of data pre-processing innovations. Together, they produce a system with unique surveillance capabilities that surpass any conventional approaches, including neural networks, in sensitivity, reliability, robustness to unreliable and possibly degrading sensors, simplicity of training, adaptability, and computational efficiency.
TNP AI_MSET Value-Add for Smart Manufacturing use cases:
Higher Production Throughput for IoT Customer Manufacturing Operations:
When a Manufacturing (MFG) company's profits are directly proportional to plant throughput, there are 4 ways TNP's patented prognostic algorithms help them increase throughput and maximize profits, increasing TNP's value proposition and competitive differentiation:
a) TNP’s AI-MSET and SPRT allow a systematic reduction in quality-assurance/quality-control (QA/QC)
testing time for the MFG company's finished products. Many types of MFG have one or a series of
quality tests they do before shipping the end products. Most likely, those quality tests are based on
thresholds, and if so, TNP's AI-MSET/SPRT can enable the testing windows to be substantially reduced
while maintaining the same (or smaller) Type-I and Type-II QT error rates (FAPs and MAPs).
If TNP conducts some beta testing with a customer and gets a set of signals their QA/QC tests
presently operate on, then we can show them within replicated iterations with our Telemetry
Parameter Synthesis System (TPSS, our TNP patented telemetry simulation system), how the
customer can significantly shorten their QA/QC testing window (which directly impacts plant
throughput) while lowering their false and missed alarm probabilities.
b) Avoid unplanned critical-path downtime of production assets. This is the classic ROI for MSET1
advanced prognostics, and the reason that one of the largest manufacturing companies in the world,
GE acquired the MSET1 IP portfolio in 2011 for $220M. GE's MSET1-based prognostic innovations
became the core of GE_Predix. TNP now has a “new and improved” Generation-3 of MSET-type
prognostics for TNP customer solutions (thanks to the original MSET1 patent expiring in June 2016,
and TNP having the original MSET1 inventor). Note that even though GE has MSET1, TNP has a suite of
proprietary prognostic innovations that leverage MSET and SPRT for solutions to manufacturing
prognostic challenges, solutions that TNP competitors cannot duplicate (because TNP owns the IP).
TNP has significant competitive differentiation with respect to Microsoft Azure, GE_Predix, Google
Analytics, and other competitive offerings.
c) Upgrade to Condition-Based Maintenance (CBM), which significantly boosts annualized throughput
metrics versus time-based preventative maintenance (PM) windows. The conventional time-based PM
windows lower overall throughput, resulting in overhauling/upgrading machinery prematurely that
is not yet exhibiting wear symptoms, and produces additional unscheduled outages because of
what we call "maintenance induced failures", i.e., the fact that technicians are dismantling,
overhauling, recalibrating, and reassembling expensive assets will lead to some human-factors errors
and assets may go down early in the next production cycle, which were totally fine before the
technicians dismantled/reassembled the assets. MSET-based CBM lowers overall Operations &
Maintenance costs while reducing penalizing challenges to critical-asset availability and actually
increases annualized throughput metrics.
d) TNP's proprietary "inferential sensor replacement" (highly accurate virtual sensors). This capability
means that an expensive production asset doesn't need to be taken offline to replace a $2 sensor that
degraded in service. Note: It is very often the case in MFG facilities (and in Utilities, Oil&Gas, and
Transportation that the sensors have a shorter MTBF than the assets the sensors are supposed to
protect. TNP’s AI-MSET in the “inferential mode” provides highly accurate analytical sensor
replacement, should sensors degrade in service.
Enhanced Asset and Facility Availability (“Up-Time”)
With AI_MSET plus SPRT, we get a dual ROI boost in overall annualized asset availability (up-time):
(a) Ultra-low missed alarm probability (MAP), which boosts the overall availability for critical
production assets by avoiding serious outages, and
(b) For manufacturing companies where prognostic alerts lead to automatic asset shutdowns, we
additionally benefit from ultra-low false alarm probabilities (FAPs).
Moreover, just the fact that TNP's prognostic solutions allow FAP and MAP to be separately controlled is a very large win for MFG facilities (because their conventional prognostics are most likely threshold based, meaning they have to pick FAP or MAP to minimize, and the other one is certainly going to go up.) TNP's solutions avoid the tyranny of the “Quality-Control sea-saw effect.”
Reduction in early-life failures (ELFs) for manufactured products
This goes back to threshold-based QA/QC tests employed throughout the manufacturing world. High-throughput MFG operations have a short testing window with a simple Pass/Fail criteria for shipped products. If one or more quality metrics trip a threshold, those products get a Fail and become scrap. (Or for expensive manufactured products, products getting a Fail will get re-worked...which also has an associated cost). If the quality metrics do not trip a threshold, those products get a Pass and ship.
We've demonstrated many times that by going to an AI-MSET approach (vs simple thresholds) then we catch incipient problems that are too small or slowly degrading to reach a threshold during the brief QA/QC testing window, but then ship to customers with the incipient degradation modes already active, and fail very early in life for the end customers. (These are called early life failures, "ELFs," in the Mfg reliability world). ELFs not only result in high warranty costs for the MFG company, but result elevated customer dissatisfaction as well.
When the author first started developing AI-MSET & SPRT prognostics in 2002 for Sun Microsystems, Sun did all their own server manufacturing. Sun Manufacturing achieved significant ROI in terms of ELF avoidance (and reduced scrap, shortened QA/QC testing windows, and concomitant higher throughputs).
Reduced Scrap Rates for Manufacturing Applications
We believe there may be a significant value proposition in extension of TNP's EP algorithmics to include not only the compute and control assets in a manufacturing plant, but also mechanical, electromechanical, and/or chemical processing assets. In many MFG operations, the scrap rate is tied directly to the FAP rate of their QA/QC testing.
Although the primary purpose of TNP's prognostic solution suite is an increase in system availability and a decrease in overall operations & maintenance (O&M) costs, it may be of interest to point out that one important element of TNP's prognostic solution suite, AI-MSET, has already demonstrated significant value in industrial manufacturing settings, in its ability to significantly reduce “scrap rates”, which adds cost to the bottom line for many types of modern manufacturing plants.
One of TNP's AI architects was personally involved with applying AI-MSET to significantly reduce scrap rates (by 25%, saving many $Ms per yr) for the largest metal-stamping manufacturing industry in the world, which happens to be consumer battery manufacturing. That industry employs very sophisticated intelligent manufacturing techniques in enormous factories that typically produce 5 million batteries per day, 365 days per year. Equipment downtime in a high-throughput facility like that is extremely costly. But even when all equipment and processes are functioning perfectly, a separate costly challenge is scrap rates. The same “sea saw” effect between Type-I and Type-II errors we discussed in the Introduction in the context of conventional system monitoring algorithms, directly affects the scrap rate for manufacturing output. Almost all types of manufacturing facilities have online quality assurance/quality control (QA/QC) testing of manufactured units. If the QA/QC methods have a high Type-II error rate, then end customers are dissatisfied, and warranty costs go up. If the QA/QC methods are tweaked to minimize Type-II error rates, then the scrap rates go up. TNP’s AI-MSET breaks this “sea-saw” relationship endemic to conventional online SPC techniques and allows simultaneously reducing Type-I and Type-II errors, which brings an additional significant ROI in terms of reduced scrap losses.
Finally, as additional evidence that AI-MSET is finding value in manufacturing applications, GE has more recently driven MSET1 into automotive manufacturing, achieving significant reductions in O&M costs, as well as significant reductions in scrap rates. [Important note: GE uses the original MSET1 algorithm, but TNP's GEN-3 AI-MSET prognostic solution suite has many additional innovations that are proprietary to TNP and result in even-lower FAPs and MAPs than original MSET1, which TNP is happy to demonstrate in any Bakeoff Evaluation between AI-MSET versus original MSET1, or any competitive anomaly-detection algorithm based on Neural Networks.]
GE has implemented MSET1 into Automotive Manufacturing plants and claims significant ROI via improvements in:
* Machine, conveyor control
* Real-Time Process & Sequence Control
* Automated Error Proofing
* Real-Time QA/QC (quality assurance, quality control)
* Real-Time Machine Control
* Asset Condition & Maintenance
* Statistical Process Control
In terms of quantitative improvements from the integration of MSET into automotive manufacturing, GE claims publicly:
25% reduced scrap costs
20% reduced overall manufacturing costs
(Note that in the following published claims by GE for manufacturing benefits of MSET1, GE refers to the algorithm we generically call “MSET” with the term “SmartSignal”)
http://www.ge.com/digital/products/smartsignal
https://www.ge.com/digital/sites/default/files/smartsignal-datasheet.pdf
http://www.geautomation.com/industries/automotive-manufacturing
Competitive Differentiation Note:
GE Predix is using the 25-year-old original MSET1 algorithm (invented by a TNP Sr Architect who was working for the US Dept of Energy at the time). The original MSET1 patent expired in 2016. TNP AI-MSET possesses multiple technological advantages over GE Predix. TNP has developed a dense portfolio of AI-MSET-based preprocessing, automated tuning, and model-optimization algorithms, bringing significant value-add for TNP manufacturing customers and competitive differentiation for TNP [because neither GE nor any other AI competitors can solve specific smart-manufacturing prognostic challenges that AI-MSET solves...without licensing the algorithms from TNP].
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